Products

Compact benchtop test units for semiconductors

AGILENT Technologies has announced the B2900A Series, its first line of compact benchtop source/measure units for testing semiconductors, components and materials.

The range provides wide voltage/current ranges and is said to have superior performance while keeping prices low.

The units are the first to provide an intuitive graphical interface with the industry’s first colour displays. They excel at fast, simple current-versus-voltage (I-V curve) characterisation of semiconductors, active/passive components and materials in research, development, manufacturing and education applications.

According to Agilent Technologies, the series provides best-in-class voltage/current ranges and precision in a single instrument.

With the instruments in this series, sourcing is precise and measurements are accurate with minimum resolution of 100 nV and 10 fA. This level of performance is unprecedented in a benchtop SMU and is more typical of high-cost semiconductor device analysers.